UV-Vis-NIR Spectrophotometer UH4150

The Hitachi UV/Visible/Near-Infrared Spectrophotometer UH4150, supplied by Guangzhou Jincheng Scientific Instruments Co., Ltd., enables high-precision measurements and serves as a powerful analytical tool in fields such as optical materials, components, and new material development. Accessories can be flexibly configured or combined according to application needs to build a customized measurement system for users.

With excellent performance and professional accessories, it is a reliable tool for evaluating optical properties.

High Reliability and Practical Optical Technology

Accurate measurement of transmittance and reflectance using parallel beams

Optical system with minimal signal level differences during detector switching

Prism-grating double monochromator enables low stray light and low polarization simultaneously

Wide range of accessories to meet various measurement needs

Diverse detector types

Accessories provided to suit different requirements

Ergonomically designed

Features:

Minimal signal differences during detector wavelength switching, enabling high-precision measurements with the UH4150

Multiple detectors mounted on the integrating sphere allow measurements across UV-Visible-NIR wavelengths. Utilizing Hitachi's proprietary integrating sphere structure and signal processing technologies, changes in absorbance values during detector switching (signal level differences) are minimized.

Hitachi's high-performance prism-grating double monochromator system achieves low stray light and low polarization

The UH4150 employs a prism-grating (P-G) double monochromator optical system, inheriting the characteristics of the U-4100 optical system. Compared to common grating-grating (G-G) systems, the P-G system shows minimal changes in S and P polarized light intensities. Even for samples with low transmittance and reflectance, the UH4150 enables low-noise measurements.

Parallel beams enable accurate measurement of reflected and scattered light

Incident angle is critical for measuring specular reflectance of solid samples. With converging beams, the incident angle varies depending on factors like lens focal length, leading to discrepancies between simulated design values and actual measurements for optical films such as conductive multilayers and prisms. However, with parallel beams, the incident angle relative to the sample remains constant, enabling high-precision specular reflectance measurements. Additionally, parallel beams can be used for haze evaluation and lens transmittance measurements.

Multiple detectors available to suit different measurement purposes

Eight types of integrating spheres with different materials, sizes, and shapes are available.

New ergonomic design

The sample compartment door has been improved for better operability. An ergonomic design facilitates sample changes and accessory operations.

Compatible with various U-4100 accessories

Universal accessories are compatible with both models. U-4100 accessories can also be used with the UH4150*4. Detachable accessories support a wider range of measurement types.

Higher sample throughput than the U-4100

While maintaining the high performance of the U-4100 optical system, the UH4150 offers higher throughput measurements. Previous models required a scanning speed of 600 mm/min for measurements at 1 nm data intervals. The UH4150 can measure at 1 nm intervals with a scanning speed of 1,200 nm/min, significantly reducing measurement time.*5 The UH4150 can measure from 240 nm to 2,600 nm in approximately 2 minutes. This is particularly effective for samples requiring measurements across UV-Visible-NIR wavelengths, such as solar reflective materials.

Configuration:

Information on the Hitachi UV/Visible/Near-Infrared Spectrophotometer UH4150 is provided by Guangzhou Jincheng Scientific Instruments Co., Ltd. For more details about spectrophotometers, please feel free to contact us.